Genetic Variation of the M5 Generation Irradiation of Mung Beans
Keywords:
Mutation, Genetic diversity, SSR markersAbstract
Yield evaluation of the M5 generation of electron beam irradiated mungbean, Chai Nat 84-1 and Chai Nat 3, was performed. The study was designed with RCB with 3 replications. Statistically significant differences were observed (p ≤ 0.5). Higher yields (98.25-105.50 kilogram/rai) were observed in the Chai Nat 84-1 M5 generations compared to the initial cultivars (84.90 Kilogram/rai). The yields of the Chai Nat 3 M5 generations were greater than those of the initial lines (70.20 Kilogram/rai). The environment might influence the higher yield. The genetic diversity study of the M5 generation varieties and initial cultivars using 9 SSR markers could divide the high yield M5 generation from the initial cultivars that they were real mutant lines. Confirmation of the mutation-induced M5 generation of mungbeans caused by mutation. These mutant lines will be the preliminary yield trials.
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